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Volumn 30, Issue 6, 1999, Pages 575-578

Development of a scanning Hall probe microscope for simultaneous magnetic and topographic imaging

Author keywords

Hall probe; Magnetism; Microscope; Surface; Tunneling

Indexed keywords


EID: 0032745523     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(99)00056-6     Document Type: Article
Times cited : (5)

References (14)
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  • 4
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    • Low temperature scanning force microscopy
    • H.-J. Güntherodt, D. Anselmetti, & E. Meyer. Dordrecht: Kluwer Academic
    • Hug H.J., Moser A., Fritz O., Stiefel B., Parashikov I. Low temperature scanning force microscopy. Güntherodt H.-J., Anselmetti D., Meyer E. Forces in Scanning Probe Methods. 1995;35-62 Kluwer Academic, Dordrecht.
    • (1995) Forces in Scanning Probe Methods , pp. 35-62
    • Hug, H.J.1    Moser, A.2    Fritz, O.3    Stiefel, B.4    Parashikov, I.5
  • 8
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    • Magnetic imaging by "force microscopy" with 100 Å resolution
    • Martin Y., Wickramasinghe H.K. Magnetic imaging by "force microscopy" with 100 Å resolution. Appl. Phys. Lett. 50:1987;1455-1457.
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    • Martin, Y.1    Wickramasinghe, H.K.2
  • 9
    • 36549090683 scopus 로고
    • High-resolution magnetic imaging of domains in TbFe by force microscopy
    • Martin Y., Ruger D., Wickramasinghe H.K. High-resolution magnetic imaging of domains in TbFe by force microscopy. Appl. Phys. Lett. 52:1988;244-246.
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    • Martin, Y.1    Ruger, D.2    Wickramasinghe, H.K.3
  • 10
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    • New selective deposition technology by electron beam induced surface reaction
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    • Matsui, S.1    Mori, K.2
  • 11
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    • Scanning Hall probe microscopy of superconductors and magnetic materials
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    • (1996) J. Vac. Sci. Technol. B , vol.14 , Issue.2 , pp. 1202-1205
    • Oral, A.1    Bending, S.J.2    Henini, M.3
  • 12
    • 0028526815 scopus 로고
    • Magnetic force microscopy using electron-beam fabricated tips
    • Rührig M., Porthun S., Lodder J.C. Magnetic force microscopy using electron-beam fabricated tips. Rev. Sci. Instrum. 65:1994;3224-3228.
    • (1994) Rev. Sci. Instrum. , vol.65 , pp. 3224-3228
    • Rührig, M.1    Porthun, S.2    Lodder, J.C.3
  • 14
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    • Design and implementation of a scanning SQUID microscope
    • Vu L.N., Van Harlingen D.J. Design and implementation of a scanning SQUID microscope. IEEE Trans. Appl. Supercond. 3:1993;1918-1921.
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    • Vu, L.N.1    Van Harlingen, D.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.