Characterization of the surface organization of nanostructured hybrid organic-inorganic materials by time-of-flight secondary ion mass spectrometry

Rapid Communications in Mass Spectrometry

Volumn 13, Issue 21, 1999, Pages 2183-2190

  Cerveau, Geneviève ^a   Corriu, Robert J P ^a   Dabosi, Josiane ^a   Fischmeister Lepeytre, Cédric ^a   Combarieu, Robert ^b  

^a UNIVERSITÉ DE MONTPELLIER   (France)

^b PSL RESEARCH UNIVERSITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL STRUCTURE; GEL; MASS SPECTROMETRY; NANOPARTICLE; STRUCTURE ANALYSIS;

ORGANIC-INORGANIC MATERIALS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SILICON COMPOUNDS; SOL-GEL PROCESS; XEROGELS;

FERROCENYL; FLEXIBLE CHARACTERISTICS; FRAGMENT IONS; HYBRID ORGANIC-INORGANIC MATERIALS; NANOSTRUCTURED HYBRIDS; ORGANIC GROUP; ORGANIC-INORGANIC HYBRID SOLIDS; ORGANICS; SURFACE ORGANIZATION; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

IONS;

EID: 0032740833     PISSN: 09514198     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0231(19991115)13:21<2183::AID-RCM773>3.0.CO;2-G     Document Type: Article

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