Towards quantitative measurements of charge transfer in complex crystals using imaging and diffraction of fast electrons

Micron

Volumn 30, Issue 5, 1999, Pages 357-369

  Wu, L ^a   Zhu, Y ^a   Tafto, J ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

Charge density and charge transfer; High temperature superconductors; Novel convergent beam electron diffraction; Quantitative electron diffraction and imaging

Indexed keywords

EID: 0032723323     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(99)00039-6     Document Type: Article

References (34)

1. 4. J. Solid State Chem. 90:1991;155.
2. 8+y by anomalous X-ray diffraction. Phys. Rev. B. 54:1996;4310-4314.
3. Fink J., Nucker N., Pellegrin E., Romberg H., Alexander M., Knupfer M. Electron energy-loss and X-ray absorption spectroscopy of curate superconductors and related compounds. J. Electron Spectrosc. Related Phenom. 66:1994;395-452.
4. Gajdardziska-Josifovska M., McCartney M., DeRuijter W.J., Smith D.J., Weiss J.K., Zuo J.M. Accurate measurements of meaning inner potential of crystal wedges using digital electron holography. Ultramicroscopy. 50:1993;285-299.
5. 8+y. Acta Cryst. A49:1993;141-148.
6. Gemming T., Mobus G., Exner M., Ernst F., Ruhle M. Ab initio HRTEM simulations of ionic crystals: a case study of sapphire. J. Microscopy. 190:1997;89-98.
7. 7 form convengent beam electron diffraction. Ultramicroscopy. 48:1993;37-41.
8. 6.5. Phys. Rev. B. 44:1991;2739-2746.
9. 10 superconductors. Phys. Rev. B. 49:1994;13154-13159.
10. 8.2 superconducting crystal based on the computer simulation of HRTEM images. Jpn. J. Appl. Phys. 27:1988;L1172-L1174.
11. Howie A. High voltage electron microscopy: the theory of high energy electron diffraction. Amelinckx S., Gevers R., Van Landuyt J. Diffraction and Imaging Techniques in Materials Science. 1978;457 North-Holland, Amsterdam.
12. International Tables of Crystallography. C:1992;Kluwer Academic, Dordrecht. pp. 475-499.
13. x superconductors. Jpn. J. Appl. Phys. 27:1988;L1661-L1664.
14. 7-δ. Phys. Rev. B. 41:1990;1863-1877.
15. 2 by high-energy electron diffraction. Acta Cryst. A50:1994;115-122.
16. Matthias B.T. Superconductivity in the periodic system. Prog. Low Temp. Phys. 2:1957;138-150.
17. x probed by O 1s and Cu 2p X-ray-absorption spectroscopy. Phys. Rev. B. 51:1995;8529-8540.
18. c superconductors. Phys. Rev B. 39:1989;6619-6629.
19. 8. Phys. Rev. B. 48:1993;1249-1253.
20. Pickett W.E. Electronic structure of the high-temperature oxide superconductors. Rev. Mod. Phys. 6:1989;433-512.
21. Rez D., Rez P., Grant I. Dirac-Fock calculations of X-ray scattering factors and contributions to the mean inner potential for electron scattering. Acta Cryst. A50:1994;481-497.
22. Rietveld H.M. A profile refinement method for nuclear and magnetic structures. J. Appl. Cryst. 2:1969;65-71.
23. Tafto J., Zhu Y., Wu L. A new approach towards measuring structure factors and valence-electron distribution in crystals with large unit-cells. Acta Cryst. A54:1998;532-542.
24. Terasaki O., Watanabe D., Gjonnes J. Determination of crystal structure factors of Si by the intersecting-Kikuchi-line method. Acta Cryst. A35:1979;895-900.
25. 3. Acta Cryst. A51:1995;7-19.
26. Tranquada J.M., Sternlieb B.J., Axe J.D., Nakamura Y., Uchida S. Evidence for stripe correlation's of spins and holes in copper oxide superconductors. Nature. 375:1995;561.
27. Vincent R., Bird D.M., Steeds J.W. Structure of AuGeAs determined by convergent-beam electon diffraction II: refinement of structural parameters. Philos. Mag. A50:1984;765-786.
28. Wu L., Zhu Y., Tafto J. Test of first-principle calculations of charge transfer and electron-hole distribution in oxide superconductors by precise measurements of structure factors. Phys. Rev. B. 59:1999;6035-6038.
29. Zhu Y., Tafto J. Direct imaging of charge modulation. Phys. Rev. Lett. 76:1996;443-446.
30. 7 using novel electron diffraction method. Philos. Mag. B75:1997;785-791.
31. Zuo J.M., O'Keefe M., Rez P., Spence J.C.H. Charge density of MgO: implications of precise new measurements for theory. Phys. Rev. Lett. 78:1997;4777-4780.
32. Zuo J.M., Spence J.C.H., O'Keeffe M. Bonding in GaAs. Phys. Rev. Lett. 61:1988;353-356.
33. Zuo J.M. Automated structure-factor refinement from convergent-beam electron diffraction patterns. Acta Cryst. A49:1993;429-435.
34. Antis et al., 1973.