Advanced form of ζ-factor method in analytical electron microscopy

Journal of Electron Microscopy

Volumn 48, Issue 5, 1999, Pages 561-568

  Fujita, Takeshi ^a   Watanabe, Masashi ^a   Horita, Zenji ^a   Nemoto, Minoru ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

Absorption correction; k factor; Ni Al system; Quantitative microanalysis; Thickness determination; Ti Al Cr system

Indexed keywords

ALUMINUM ALLOYS; BINARY ALLOYS; ELECTRON MICROSCOPY; TERNARY ALLOYS; TITANIUM ALLOYS; VANADIUM ALLOYS;

ABSORPTION CORRECTIONS; ANALYTICAL ELECTRON MICROSCOPY; CORRECTION TERMS; CR SYSTEM; FACTOR METHODS; K FACTOR; NI-AL SYSTEM; QUANTITATIVE MICROANALYSIS; THICKNESS DETERMINATION; TI-AL-CR SYSTEM;

CHROMIUM ALLOYS;

EID: 0032716634     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023716     Document Type: Article

References (14)

1. Watanabe M, Horila Z, and Nemoto M (1996) Absorption correction and thickness determination using the ζ factor in quantitative X-ray microanalysis. Ultramicroscopy 65: 187-198.
2. Watanabe M, Horita Z, and Nemoto M (1997) Analytical electron microscopy study of diffusion-bonded multiphase system. Interface Sci. 4: 229-241.
3. Watanabe M, Horita Z, and Nemoto M (1997) Measurements of interdiffusion coefficients in Ni-Al system. Defect Diffusion Forum 143-147: 345-350.
4. Williams D B, Watanabe M, and Carpenter D T (1998) Thin film analysis and chemical mapping in the analytical electron microscope. Microchimica Acta Suppl. 15: 49-57.
5. Tanaka S, Watanabe M, Horita Z, and Nemoto M (1998) Application of ζ-factor method to Ti-Al-Ct system in analytical electron microscopy. J. Electron Microsc. 47: 9-15.
6. Watanabe M, Carpenter D T, Ackland D W, and Williams D B (1998) The ζ-factor approach for quantitative composition and thickness mapping in AEM-XEDS. In: Electron Microscopy 1998 Volume III, eds Benavides HAC and Yacaman J, pp. 565-566, (Institute of Physics Publishing, Bristol).
7. Goldstein J I, Costley J L, Lorimer G W, and Reed SJB (1977) Quantitative X-ray analysis in the electron microscope. In: Scanning Electron Microscopy 1977, Vol. I, ed. Johari O, pp. 315-324, (IITRI, Chicago, IL).
8. Williams D B (1984) Practical Analytical Electron Microscopy in Materials Science, Chapter 4, p. 55, (Philips Electron Optics Publishing Group, Mahwah, NJ).
9. Horita Z, Sano T, and Nemoto M (1989) Energy dispersive X-ray microanalysis in the analytical electron microscope. ISIJ Int. 29: 179-190.
10. Heinrich K F J (1986) Mass absorption coefficients for electron probe microanalysis. In: Proceedings of the 11th International Congress on X-Ray Optics and Microanalysis, eds Brown J D and Packwood R H, pp. 67-119, (University of Western Ontario, Canada).
11. Horita Z, Sano T, and Nemoto M (1987) Simplification of X-ray absorption correction in thin-sample quantitative microanalysis. Ultramicroscopy 21: 271-276.
12. Horita Z, McCartney M R, and Weiss J K (1992) Computer-assisted extrapolation method for absorption correction in quantitative X-ray microanalysis. Ultramicroscopy 45: 263-265.
13. Morris P L, Ball M D, and Statham P J (1980) The correction of thin foil microanalysis data for X-ray absorption effects. In: Electron Microscopy and Analysis 1979, Inst. Phys. Conf. Ser 52, ed. Mulvey T, pp. 413-416, (The Institute of Physics, Bristol and London).
14. Horita Z, Ichitani K, Sano T, and Nemoto M (1989) Applicability of the differential X-ray absorption method to the determinations of foil thickness and local composition in the analytical electron microscope. Phil. Mag. A 59: 939-952.