Application of ζ-factor method to Ti-Al-Cr system in analytical electron microscopy

Journal of Electron Microscopy

Volumn 47, Issue 1, 1998, Pages 9-15

  Tanaka, Satoru ^a   Watanabe, Masashi ^a,b   Horita, Zenji ^a   Nemoto, Minoru ^a  

^a KYUSHU UNIVERSITY   (Japan)

^b Lehigh University   (United States)

Author keywords

Absorption correction; Ratio technique; Thickness determination

Indexed keywords

ALUMINUM ALLOYS; CHROMIUM ALLOYS; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; TERNARY ALLOYS;

ABSORPTION CORRECTIONS; ANALYTICAL ELECTRON MICROSCOPY; CR SYSTEM; FACTOR METHODS; RATIO TECHNIQUE; SIMULTANEOUS DETERMINATIONS; THICKNESS DETERMINATION;

TITANIUM ALLOYS;

EID: 0031945048     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023564     Document Type: Article

References (18)

1. Goldstein J I, Costley J L, Lorimer G W, and Reed S J B (1977) Quantitative X-ray analysis in the electron microscope. In: Scanning Electron Microscopy 1977, Vol. 1, ed. Johari O, pp. 315-324, (IITRI, Chicago, IL).
2. Van Cappellen E, Van Dyck D, Van Landuyt J and Adams F (1983) A parameterless method for quantitative X-ray microanalysis of homogeneous thin foils, J. Microsc. Spectrosc. Electron 8: 16a-16a.
3. Van Cappellen E (1990) On the parameterless correction method in X-ray microanalysis. Microsc. Microanal. Microstruct. 1: 1.
4. Eibl O (1993) New method for absorption correction in high-accuracy, quantitative EDX microanalysis in the TEM including low-energy X-ray lines, Ultramicroscopy 50: 179-188.
5. ANi factors for quantitative microanalysis of nickel base alloys. J.Electron Microsc 35: 324-334.
6. Horita Z, Sano T and Nemoto M (1987) Simplification of X-ray absorption correction in thin-sample quantitative microanalysis, Ultramicroscopy 21: 271-276.
7. Horita Z, Sano T and Nemoto M (1991) A new form of the extrapolation method for absorption correction in quantitative X-ray microanalysis with the analytical electron microscope, Ultramicroscopy 35: 27-36.
8. Horita Z, McCartney M R and Weiss J K (1992) Computer-assisted extrapolation method for absorption correction in quantitative X-ray microanalysis, Ultramicroscopy 45: 263-265.
9. Morris P L, Ball M D and Statham P J (1980) The correction of thin foil microanalysis data for X-ray absorption effects. In: Electron Microscopy and Analysis 1979, Inst. Phys. Conf. Ser 52, ed. Mulvey T, pp. 413-416, (The Institute of Physics, Bristol and London).
10. Horita Z, Ichitani K, Sano T, and Nemoto M (1989) Applicability of the differential X-ray absorption method to the determinations of foil thickness and local composition in the analytical electron microscope, Phil. Mag. A 59: 919-952.
11. Watanabe M, Horita Z and Nemoto M (1996) Absorption correction and thickness determination using the ζ-factor in quantitative X-ray microanalysis, Ultramicroscopy 65: 187-198.
12. Watanabe M, Horita Z, and Nemoto M (1997) Analytical electron microscopy study of diffusion-bonded multiphase system, Interface Science 4: 229-241.
13. Watanabe M, Horita Z, and Nemoto M (1997) Measurements of interdiffusion coefficients in Ni-Al system, Defect Diffusion Forum 143-147: 345-350.
14. Watanabe M, Horita Z, and Nemoto M (1997) Observations of diffusion-couple interfaces in Ni-Al system, Defect Diffusion Forum 143-147: 637-642.
15. Cliff G and Lorimer G W (1975) The quantitative analysis of thin specimens, J. Microsc. 103: 203-207.
16. Heinrich K F J (1986) Mass absorption coefficients for electron probe microanalysis. In: Proc. 11th Int. Congr. on X-Ray Optics and Microanalysis, eds Brown J D and Packwood R H, pp. 67-119, (University of Western Ontario, Canada).
17. Ogden H R, Makyuth D J, Finlay W L, and Jaffee R I (1953) Mechanical properties of high purity Ti-Al alloys, Trans. AIME 197: 267-272.
18. Nakamura H, Takeyama M, Wei L, Yamabe Y, and Kikuchi M (1993) Phase equilibria among the α, β and γ phase in the Ti-Al-X (V, Nb, Cr, Mo) system at 1473 and 1573 K. In: Proc 3rd Japan International SAMPE Symp., eds Yamaguchi M and Fukutomi H, pp. 1353-1358, (The Japan Chapter of SAMPE, Tokyo).