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Volumn 568, Issue , 1999, Pages 49-54

Decaborane as ion source material for boron implantation

Author keywords

[No Author keywords available]

Indexed keywords

BORON COMPOUNDS; DIFFUSION IN SOLIDS; DISSOCIATION; ION IMPLANTATION; ION SOURCES; IONIZATION OF SOLIDS; KINETIC ENERGY; MOS DEVICES; SEMICONDUCTING BORON; SEMICONDUCTING SILICON;

EID: 0032691808     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-568-49     Document Type: Article
Times cited : (6)

References (13)
  • 1
    • 11644305483 scopus 로고
    • The National Technology Roadmap for Semiconductors
    • "The National Technology Roadmap for Semiconductors", Semiconductor Industry Association, 1994.
    • (1994) Semiconductor Industry Association
  • 3
    • 0027189428 scopus 로고
    • Plasma immersion ion implantation of semiconductors
    • N.W. Cheung, W. En, E. Jones, and C. Yu, "Plasma immersion ion implantation of semiconductors", Mat. Re.sSoc. Symp. Proc. vol. 279, p. 297, 1993.
    • (1993) Mat. Re.sSoc. Symp. Proc. , vol.279 , pp. 297
    • Cheung, N.W.1    En, W.2    Jones, E.3    Yu, C.4
  • 7
    • 36549102579 scopus 로고
    • Rapid annealing and the anomalous diffusion of ion implanted boron into silicon
    • A. E. Michel, W. Rausch, P. A. Rousheims, and R. H. Kastl, "Rapid annealing and the anomalous diffusion of ion implanted boron into silicon", Appl. Phys. Lett. vol. 50, 416(1987).
    • (1987) Appl. Phys. Lett. , vol.50 , pp. 416
    • Michel, A.E.1    Rausch, W.2    Rousheims, P.A.3    Kastl, R.H.4
  • 13
    • 33751148671 scopus 로고    scopus 로고
    • ATMI, private communication
    • M. Donatucci and L. Wang, ATMI, private communication.
    • Donatucci, M.1    Wang, L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.