From design validation to hardware testing: A unified approach

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 14, Issue 1, 1999, Pages 133-140

  Al Hayek, Ghassan ^a   Robach, Chantal ^a  

^a Grenoble Institute of Technology   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE DESCRIPTION LANGUAGES; INTEGRATED CIRCUIT LAYOUT;

MUTATION TESTING; VERILOG HARDWARE DESCRIPTION LANGUAGES (VHDL);

BUILT-IN SELF TEST;

EID: 0032690974     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1008317826940     Document Type: Article

References (10)

1. Y. Levendel and P. Menon, "Test Generation Algorithms for Computer Hardware Description Languages," IEEE Transactions on Computers, Vol. C-31, No. 7, pp. 577-588, 1982.
2. T. Lin and S.Y. Su, "The S-algorithm: A Promising Solution for Systematic Functional Test Generation," IEEE Transactions On Computer-Aided-Design, Vol. CAD-4, No. 7, pp. 250-263, 1985.
3. S. Ghosh and T.J. Chakraborty, "On Behavioral Fault Modeling for Digital Designs," Journal of Electronic Testing: Theory and Applications, Vol. 2, pp. 135-151, 1991.
4. J.R. Armstrong, "Chip-Level Modeling with HDLs," IEEE Design and Test of Computers, Vol. 5, No. 1, pp. 577-588, 1988.
5. M.C. Hansen and J.P. Hayes, "High-level Test Generation Using Physical-Induced Faults," IEEE VLSI Test Symposium (VTS'13), Princeton, NJ, USA, pp. 20-28, 1995.
6. M.D. O'Neill, D.D. Jani, C.H. Cho, and J.R. Armstrong, "BTG: A Behavioral Test Generator," 9th International Symposium on CHDLs and Their Applications, Washington, 1989, pp. 347-360.
7. C.H. Cho and J.R. Armstrong, "B-algorithm: A Behavioral Test Generation Algorithm," International Test Conference, 1994, pp. 968-979.
8. G. Al Hayek and C. Robach, "From Specification Validation to Hardware Testing: A Unified Method," International Test Conference (ITC'96), Washington DC, USA, 1996, pp. 885-893.
9. R. DeMillo, R. Lipton, and F. Sayward, "Hints on Test Data Selection: Help for the Practicing Programmer," IEEE Computer, Vol. 11, No. 4, pp. 34-41, 1978.
10. R. DeMillo and A. Offutt, "Constraint-Based Automatic Test Data Generation," IEEE Transactions on Computers, Vol. 17, No. 9, pp. 900-910, 1991.