Potential diagnostics for the next-generation light sources

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 429, Issue 1, 1999, Pages 293-298

  Lumpkin, A H ^a   Yang, B X ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON EMISSION; LINEAR ACCELERATORS; MONOCHROMATORS; PARTICLE BEAMS; PARTICLE DETECTORS; SPONTANEOUS EMISSION; STORAGE RINGS; STREAK CAMERAS; X RAY CAMERAS;

BENDING MAGNETS; SELF-AMPLIFIED SPONTANEOUS EMISSION (SASE); UNDULATORS; X RAY MONOCHROMATORS;

FREE ELECTRON LASERS;

EID: 0032688579     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)00130-8     Document Type: Article

References (6)

1. Lumpkin A.H. Nucl. Instr. and Meth. A. 393:1997;147.
2. Hamamatsu Photonics, C5680 Universal Streak Camera Data Sheet, May 1993.
3. B.X. Yang, A.H. Lumpkin, G.A. Goeppner, S. Sharma, E. Rotela, A.C. Sheng, E. Moog, Status of the APS diagnostics undulator beamline, Proceedings of the 1997 Particle Accelerator Conference, May 12-16, 1997, Vancouver, BC, Canada, submitted for publication.
4. Tarazona E., Ellaume P. Rev. Sci. Instr. 66:1995;2.
5. A.H. Lumpkin, B.X. Yang, First multi-GeV particle-beam measurements using a synchroscan and dual-sweep X-ray streak camera, Proceedings of BIW'98, SLAC, May 4-7, 1998, AIP Conference Proc. No. 451, 1998, p. 214.
6. A. Lumpkin, B. Yang, W. Gai, W. Cieslik, Initial tests of the dual-sweep streak camera system planned for APS particle-beam diagnostics, Proceedings of the 1995 PAC, vol. 4, Dallas, Texas, May 1-5, 1995 (1996) p. 2476.