Initial tests of the dual-sweep streak camera system planned for APS particle-beam diagnostics

Proceedings of the IEEE Particle Accelerator Conference

Volumn 4, Issue , 1995, Pages 2476-2478

  Lumpkin, A ^a   Yang, B ^a   Gai, W ^a   Cieslik, W ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CAMERAS; NEODYMIUM LASERS; PARTICLE ACCELERATORS; PHOTOCATHODES; PHOTODIODES; PHOTOELECTRIC DEVICES; PULSED LASER APPLICATIONS; PUMPING (LASER); SYNCHROTRON RADIATION; ULTRAVIOLET RADIATION; X RAYS;

ADVANCED PHOTON SOURCES; ARGONNE WAKEFIELD ACCELERATOR; PARTICLE BEAM DIAGNOSTICS; PHOTOELECTRIC INJECTOR;

PARTICLE BEAM DYNAMICS;

EID: 0029452344     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)