메뉴 건너뛰기




Volumn 35, Issue 14, 1999, Pages 1194-1195

40 Gbit/s decision IC using InP/InGaAs composite-collector heterojunction bipolar transistors

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; FREQUENCIES; HETEROJUNCTION BIPOLAR TRANSISTORS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MIM DEVICES; OLEFINS; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE;

EID: 0032687272     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19990798     Document Type: Article
Times cited : (13)

References (6)
  • 4
    • 0024959397 scopus 로고
    • 3.5GHz bandwidth, 30 dB gain Si monolithic amplifier
    • ISHIHARA, N., KONAKA, S., and KAMOTO, T.: '3.5GHz bandwidth, 30 dB gain Si monolithic amplifier', Electron. Lett., 1989, 25, pp. 217-218
    • (1989) Electron. Lett. , vol.25 , pp. 217-218
    • Ishihara, N.1    Konaka, S.2    Kamoto, T.3
  • 5
    • 0032477235 scopus 로고    scopus 로고
    • Annealing effect on C-doped InGaAs grown by metalorganic chemical vapor deposition
    • WATANABE, N., KUMAR, S.A.K., YAMAHATA, S., and KOBAYASHI, T.: 'Annealing effect on C-doped InGaAs grown by metalorganic chemical vapor deposition', J. Cryst. Growth, 1998, 195, pp. 48-53
    • (1998) J. Cryst. Growth , vol.195 , pp. 48-53
    • Watanabe, N.1    Kumar, S.A.K.2    Yamahata, S.3    Kobayashi, T.4
  • 6
    • 0032136503 scopus 로고    scopus 로고
    • Initial degradation of base-emitter junction in carbon-doped InP/InGaAs HBT's under bias and temperature stress
    • KURISHIMA, K., YAMAHATA, S., NAKAJIMA, H., ITO, H., and WATANABE, N.: 'Initial degradation of base-emitter junction in carbon-doped InP/InGaAs HBT's under bias and temperature stress', IEEE Electron Device Lett., 1998, 19, pp. 303-305
    • (1998) IEEE Electron Device Lett. , vol.19 , pp. 303-305
    • Kurishima, K.1    Yamahata, S.2    Nakajima, H.3    Ito, H.4    Watanabe, N.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.