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Volumn 348, Issue 1, 1999, Pages 38-43
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Effects of homo-epitaxial LaAlO3 layer on microstructural properties of SrTiO3 films grown on LaAlO3 substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL DEFECTS;
CRYSTAL MICROSTRUCTURE;
DEPOSITION;
HIGH RESOLUTION ELECTRON MICROSCOPY;
LANTHANUM COMPOUNDS;
PULSED LASER APPLICATIONS;
STRONTIUM COMPOUNDS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
LANTHANUM ALUMINATE;
MICROWAVE PROPERTIES;
STRONTIUM TITANATE;
STRUCTURAL DEFECTS;
STRUCTURAL PROPERTIES;
EPITAXIAL GROWTH;
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EID: 0032686949
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(98)01767-2 Document Type: Article |
Times cited : (11)
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References (15)
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