Microstructure and atomic effects on the electroluminescent efficiency of SrS:Ce thin film devices

Journal of Applied Physics

Volumn 82, Issue 10, 1997, Pages 5138-5143

  Warren, W L ^a   Seager, C H ^a   Sun, S S ^b   Naman, A ^c   Holloway, P H ^c   Jones, K S ^c   Soininen, E ^d  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b Planar America Inc   (United States)

^c J Crayton Pruitt Family Department of Biomedical Engineering   (United States)

^d Planar Systems Inc Finland   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL FIELDS; CRYSTALLINE DEFECTS; ELECTROLUMINESCENT EFFICIENCIES; ELECTRON PARAMAGNETIC RESONANCE; GRAIN SIZE; THERMAL ANNEALS; X-RAY DIFFRACTION DATA;

CERIUM; ELECTROLUMINESCENCE; PARAMAGNETIC RESONANCE; RAPID THERMAL PROCESSING; THIN FILM DEVICES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; ACTIVATION ENERGY; ANNEALING; CRYSTAL DEFECTS; CRYSTAL MICROSTRUCTURE; LIGHT EMISSION; SPECTRUM ANALYSIS; STRONTIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

CERIUM COMPOUNDS; THIN FILM DEVICES;

ATOMIC EFFECTS; ELECTROLUMINESCENT EFFICIENCY; EMITTED LIGHT SPECTRUM; STRONTIUM SULFIDE;

EID: 0031275898     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366547     Document Type: Article

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