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Volumn 1, Issue , 1999, Pages 312-317

Electromechanical characteristics of a bondless pressure contact IGBT

Author keywords

[No Author keywords available]

Indexed keywords

GATES (TRANSISTOR); INTEGRATED CIRCUIT LAYOUT;

EID: 0032686292     PISSN: None     EISSN: None     Source Type: None    
DOI: 10.1109/apec.1999.749659     Document Type: Article
Times cited : (28)

References (12)
  • 1
    • 0004893982 scopus 로고    scopus 로고
    • Reliability of high power IGBT modules testing on thermal fatigue effects due to traction cycles
    • Trondheim Norway
    • A.Hamidi, G.Coquery and R.Lallemand, "Reliability of high power IGBT modules testing on thermal fatigue effects due to traction cycles", EPE'97, Trondheim Norway, 1997, pp 3.118 - 3.123.
    • (1997) EPE'97 , pp. 3118-3123
    • Hamidi, A.1    Coquery, G.2    Lallemand, R.3
  • 3
    • 0029178676 scopus 로고
    • Thermal stress related packaging failure in power IGBT modules
    • Yokohama Japan
    • W. Wu, M. Held, P. Jacob, P. Scacco and A Birolini, "Thermal stress related packaging failure in power IGBT modules", ISPSD'95, Yokohama Japan, 1995, pp 330 - 334.
    • (1995) ISPSD'95 , pp. 330-334
    • Wu, W.1    Held, M.2    Jacob, P.3    Scacco, P.4    Birolini, A.5
  • 4
    • 0029190556 scopus 로고
    • Investigation on the long term reliability of power IGBT modules
    • Yokohama Japan
    • W. Wu, M. Held, P. Jacob, P. Scacco and A.Birolini, "Investigation on the long term reliability of power IGBT modules", ISPSD'95, Yokohama Japan, 1995, pp 443 - 448.
    • (1995) ISPSD'95 , pp. 443-448
    • Wu, W.1    Held, M.2    Jacob, P.3    Scacco, P.4    Birolini, A.5
  • 6
    • 84885483836 scopus 로고
    • Power pack IGBT: High power (2.5kV, IkA) RC-IGBT with highly reliable flat package
    • Sevillia Spain, Late paper
    • Y.Seki, Y.Takahashi, T.Koga, M.lchijyou and H.Kirihata, "Power pack IGBT: High power (2.5kV, IkA) RC-IGBT with highly reliable flat package"EPE'95, Sevillia Spain, 1995, Late paper.
    • (1995) EPE'95
    • Seki, Y.1    Takahashi, Y.2    Koga, T.3    Lchijyou, M.4    Kirihata, H.5
  • 7
    • 0030658446 scopus 로고    scopus 로고
    • Pressure contact assembley technology of high power devices
    • Weimar Germany
    • H.Matsuda, M.Hiyoshi and N.Kawamura, "Pressure contact assembley technology of high power devices" ISPSD'97, Weimar Germany, 1997, pp 17-24.
    • (1997) ISPSD'97 , pp. 17-24
    • Matsuda, H.1    Hiyoshi, M.2    Kawamura, N.3
  • 9
    • 6344229509 scopus 로고    scopus 로고
    • 3.3kV and 2.5kV Press Pack IGBT Switching performance and mechanical reliability
    • Nuremberg Germany
    • M.Hiyoshi and K.Nishitani," 3.3kV and 2.5kV Press Pack IGBT Switching performance and mechanical reliability", PCIM - Europe, Nuremberg Germany, 1997, pp 205 to 215.
    • (1997) PCIM - Europe , pp. 205-215
    • Hiyoshi, M.1    Nishitani, K.2
  • 10
    • 0002276071 scopus 로고
    • Reliability of 400A IGBT modules for traction convereters contribution on the power thermal fatigue influence on life expectancy
    • Sevillia Spain
    • G.Coquery, R.Lallemand, D.Wagner and P.Gibard, "Reliability of 400A IGBT modules for traction convereters contribution on the power thermal fatigue influence on life expectancy", EPE'97, Sevillia Spain 1995, pp 1.060 to 1.065.
    • (1995) EPE'97 , pp. 1060-1065
    • Coquery, G.1    Lallemand, R.2    Wagner, D.3    Gibard, P.4
  • 11
    • 0006951718 scopus 로고    scopus 로고
    • Multichip high power IGBT modules for traction and industrial applications
    • Trondheim Norway
    • K.Sommer, J.Gottert, G.Lefranc and R.Spanke, "Multichip high power IGBT modules for traction and industrial applications", EPE'97, Trondheim Norway, 1997, pp 1.112 to 1.116.
    • (1997) EPE'97 , pp. 1112-1116
    • Sommer, K.1    Gottert, J.2    Lefranc, G.3    Spanke, R.4
  • 12
    • 0004897499 scopus 로고    scopus 로고
    • Investigation on fuses against case explosion
    • Nuremberg Germany
    • S. Duong, C. Schaeffer, F. Sarrus and C. Mulertt, "Investigation on fuses against case explosion" PCIM - Europe, Nuremberg Germany, 1997, pp 123 to 132.
    • (1997) PCIM - Europe , pp. 123-132
    • Duong, S.1    Schaeffer, C.2    Sarrus, F.3    Mulertt, C.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.