Selective removal of matrix ion peaks in plasma source time-of-flight mass spectrometry: Ion deflection and detector gating

Journal of analytical atomic spectrometry

Volumn 14, Issue 9, 1999, Pages 1523-1526

  Hang, Wei ^a   Yan, Xiaomei ^a   Wayne, David M ^a   Olivares, Jose A ^a   Harrison, W W ^b   Majidi, Vahid ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b Los Alamos National Laboratory ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GLOW DISCHARGES; IONS; PLASMA DIAGNOSTICS; PLASMA SOURCES;

TIME-OF-FLIGHT MASS SPECTROMETRY (TOFMS);

MASS SPECTROMETRY;

EID: 0032684463     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/A902211B     Document Type: Article

References (10)

1. W. C. Wiley and I. H. Mclaren, Rev. Sci. Instrum., 1955, 26, 1150.
2. D. P. Myers, G. Li, P. Yang and G. M. Hieftje, J. Am. Soc. Mass Spectrom., 1994, 4, 1008.
3. W. Hang, C. Baker, B. W. Smith, J. D. Winefordner and W. W. Harrison, J. Anal. At. Spectrom., 1997, 12, 143.
4. D. P. Myers, P. P. Mahoney, G. Li and G. M. Hieftje, J. Am. Soc. Mass Spectrom., 1995, 6, 920.
5. C. D. Hanson and C. L. Just, Anal. Chem., 1994, 66, 3676.
6. O. Vorm and P. Roepstorff, J. Mass Spectrom., 1996, 31, 351.
7. A. Westman, G. Brinkmalm and D. F. Barofsky, Int. J. Mass Spectrom. Ion Processes, 1997, 169/170, 79.
8. P. R. Vlasak, D. J. Beussman, M. R. Davenport and C. G. Enke, Rev. Sci. Instrum., 1996, 67, 68.
9. A. J. Peurrung and J. Fajans, Rev. Sci. Instrum., 1993, 64, 52.
10. R. Luppi, F. Pecorella and I. Cerioni, Rev. Sci. Instrum., 1984, 55, 2034.