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Volumn 437, Issue 3, 1999, Pages

Time-resolved measurements of the formation of single-domain epitaxial Ni films on MgO(111) substrates using in-situ RHEED analysis

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; MAGNESIA; MAGNETRON SPUTTERING; NICKEL; NUCLEATION; REACTION KINETICS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SINGLE CRYSTALS; SPUTTER DEPOSITION; SURFACE ROUGHNESS;

EID: 0032683443     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00755-4     Document Type: Article
Times cited : (9)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.