|
Volumn 437, Issue 3, 1999, Pages
|
Time-resolved measurements of the formation of single-domain epitaxial Ni films on MgO(111) substrates using in-situ RHEED analysis
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CRYSTAL ATOMIC STRUCTURE;
CRYSTAL ORIENTATION;
EPITAXIAL GROWTH;
MAGNESIA;
MAGNETRON SPUTTERING;
NICKEL;
NUCLEATION;
REACTION KINETICS;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SINGLE CRYSTALS;
SPUTTER DEPOSITION;
SURFACE ROUGHNESS;
ULTRAHIGH VACUUM DC MAGNETRON SPUTTERING;
METALLIC FILMS;
|
EID: 0032683443
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(99)00755-4 Document Type: Article |
Times cited : (9)
|
References (28)
|