Nanoscale Indentation and Scratch of Short Carbon Fiber Reinforced PEEK/PTFE Composite Blend by Atomic Force Microscope Lithography

Applied Composite Materials

Volumn 6, Issue 1, 1999, Pages 1-18

  Han, Yanchun ^a   Schmitt, Stefan ^a   Friedrich, Klaus ^a  

^a INSTITUT FÜR VERBUNDWERKSTOFFE GMBH   (Germany)

Author keywords

Atomic force microscope (AFM); Nanoscale scratch and indentation tests; Short carbon fiber reinforced PEEK PTFE composite blend; SPM lithography

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRACK INITIATION; DEFORMATION; LITHOGRAPHY; MICROCRACKS; POLYETHER ETHER KETONES; POLYMER BLENDS; POLYTETRAFLUOROETHYLENES; SURFACE PROPERTIES; WEAR OF MATERIALS;

INDENTATION TESTS; SCRATCH RESISTANCE; SCRATCH TESTS;

CARBON FIBER REINFORCED PLASTICS;

EID: 0032682585     PISSN: 0929189X     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008812915701     Document Type: Article

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