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Volumn 110, Issue 8, 1999, Pages 375-377

Reply to `Rebuttal of `The relationship of lens aberrations to image aberrations in electron optics'' by P.W. Hawkes

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; DIFFERENTIAL EQUATIONS; ELECTROSTATIC LENSES; IMAGE QUALITY; RAY TRACING;

EID: 0032682457     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (6)

References (9)
  • 1
    • 0032678791 scopus 로고    scopus 로고
    • The relationship of lens aberrations to image aberrations in electron optics
    • Rempfer GF: The relationship of lens aberrations to image aberrations in electron optics, Optik 110 (1999) 17-24
    • (1999) Optik , vol.110 , pp. 17-24
    • Rempfer, G.F.1
  • 2
    • 0032643452 scopus 로고    scopus 로고
    • Rebuttal of the "The relationship of lens aberrations to image aberrations in electron optics" by G. F. Rempfer
    • submitted
    • Hawkes PW: Rebuttal of the "The relationship of lens aberrations to image aberrations in electron optics" by G. F. Rempfer. Optik (submitted 1999)
    • (1999) Optik
    • Hawkes, P.W.1
  • 3
    • 36549090917 scopus 로고
    • Unipotential electrostatic lenses: Paraxial properties and aberrations of focal length and focal point
    • Rempfer GF: Unipotential electrostatic lenses: paraxial properties and aberrations of focal length and focal point. J. Appl. Phys. 57 (1985) 2385-2401
    • (1985) J. Appl. Phys. , vol.57 , pp. 2385-2401
    • Rempfer, G.F.1
  • 6
    • 0032386260 scopus 로고    scopus 로고
    • Lenses for electron microscopy and microanalysis: Shadowgraph method of determining focal properties and aberration coefficients
    • Rempfer GF, Fyfield MS, Griffith OH: Lenses for electron microscopy and microanalysis: shadowgraph method of determining focal properties and aberration coefficients. Microsc. Microanal. 4 (1998) 34-49
    • (1998) Microsc. Microanal. , vol.4 , pp. 34-49
    • Rempfer, G.F.1    Fyfield, M.S.2    Griffith, O.H.3
  • 7
    • 37949044568 scopus 로고
    • Aberration correction in a low voltage SEM by a multipole corrector
    • Zach J, Haider M: Aberration correction in a low voltage SEM by a multipole corrector. Nucl. Instr. Methods Phys. Res. A 363 (1995) 316-325
    • (1995) Nucl. Instr. Methods Phys. Res. A , vol.363 , pp. 316-325
    • Zach, J.1    Haider, M.2
  • 8
    • 0031527309 scopus 로고    scopus 로고
    • Simultaneous correction of spherical and chromatic aberrations with an electron mirror: An electron optical achromat
    • Rempfer GF, Deloge DM, Skoczylas WP, Griffith OH: Simultaneous correction of spherical and chromatic aberrations with an electron mirror: An electron optical achromat. Microsc. Microanal. 3 (1997) 14-27
    • (1997) Microsc. Microanal. , vol.3 , pp. 14-27
    • Rempfer, G.F.1    Deloge, D.M.2    Skoczylas, W.P.3    Griffith, O.H.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.