Data parallel-fault simulation

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 7, Issue 2, 1999, Pages 183-190

  Amin, Minesh B ^a,b   Vinnakota, Bapiraju ^c  

^a IEEE

^b SYNOPSYS INC   (United States)

^c UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; INTEGRATED CIRCUIT TESTING; LOGIC GATES; PARALLEL PROCESSING SYSTEMS;

DATA PARALLEL-FAULT SIMULATION;

VLSI CIRCUITS;

EID: 0032679387     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/92.766745     Document Type: Article

References (18)

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