Doppler broadening spectroscopy using the FAST-ComTec two-dimensional coincidence system: A case study

Applied Surface Science

Volumn 149, Issue 1, 1999, Pages 110-115

  Gebauer, J ^a   Krause Rehberg, R ^a   Eichler, S ^a   Borner F ^a  

^a MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DOPPLER EFFECT; GAMMA RAYS; METAL FOIL; PARTICLE BEAMS; PARTICLE DETECTORS; SEMICONDUCTING GERMANIUM; SEMICONDUCTOR DEVICES; SODIUM; SPECTROSCOPIC ANALYSIS;

COINCIDENCE SPECTROSCOPY; DOPPLER BROADENING SPECTROSCOPY; POSITRON ANNIHILATION; POSITRON BEAMS; SEMICONDUCTOR DETECTORS;

POSITRONS;

EID: 0032678926     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00184-1     Document Type: Article

References (11)

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