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Volumn 14, Issue 5, 1999, Pages 1896-1903

Residual stress fields in sol-gel derived thin TiO2 layers

Author keywords

[No Author keywords available]

Indexed keywords

CONSOLIDATION; CRYSTALLIZATION; CURING; DENSIFICATION; DRYING; GRAIN GROWTH; MORPHOLOGY; PHASE TRANSITIONS; RESIDUAL STRESSES; SCANNING ELECTRON MICROSCOPY; SOL-GELS; TITANIUM DIOXIDE;

EID: 0032674737     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1999.0254     Document Type: Article
Times cited : (9)

References (19)
  • 3
    • 85038057042 scopus 로고    scopus 로고
    • Thesis, Rijksuniversiteit Groningen
    • F. van Looyengoed, Thesis, Rijksuniversiteit Groningen (1996), p. 19.
    • (1996) , pp. 19
    • Van Looyengoed, F.1
  • 9
    • 0003472812 scopus 로고
    • Addison-Wesley, Reading, MA
    • B. E. Warren, X-ray Diffraction (Addison-Wesley, Reading, MA, 1969), p. 253.
    • (1969) X-ray Diffraction , pp. 253
    • Warren, B.E.1
  • 16
    • 0029228531 scopus 로고
    • Thin Films: Stresses and Mechanical Properties V, edited by S. P. Baker, P. Børgesen, P. H. Townsend, C. A. Ross, and C. A. Volkert, Pittsburgh, PA
    • N. J. Hess and G. J. Exarhos, in Thin Films: Stresses and Mechanical Properties V, edited by S. P. Baker, P. Børgesen, P. H. Townsend, C. A. Ross, and C. A. Volkert (Mater. Res. Soc. Symp. Proc. 356, Pittsburgh, PA, 1995), p. 597.
    • (1995) Mater. Res. Soc. Symp. Proc. , vol.356 , pp. 597
    • Hess, N.J.1    Exarhos, G.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.