Structural and dielectric properties of Bi4Ti3O12 thin films prepared by metalorganic solution deposition

Applied Physics A: Materials Science and Processing

Volumn 68, Issue 5, 1999, Pages 547-552

  Wang, X S ^a   Zhang, Y J ^a   Zhang, L Y ^b   Yao, X ^b  

^a XIDIAN UNIVERSITY   (China)

^b XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BISMUTH COMPOUNDS; CRYSTAL MICROSTRUCTURE; DEPOSITION; DIELECTRIC PROPERTIES OF SOLIDS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; PERMITTIVITY; POLARIZATION; STRAIN; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

ANNEALING TEMPERATURE; FILM THICKNESS; METALORGANIC SOLUTION DEPOSITION;

THIN FILMS;

EID: 0032674238     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050938     Document Type: Article

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