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Volumn 14, Issue 4, 1999, Pages 312-317

Direct current and alternating current performance in InGaP/InxGa1-xAs FETs using airbridge gate with multiple piers

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CARRIER MOBILITY; ELECTRIC BREAKDOWN; LEAKAGE CURRENTS; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DOPING; THERMAL EFFECTS; TRANSCONDUCTANCE;

EID: 0032673196     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/14/4/004     Document Type: Article
Times cited : (7)

References (13)
  • 2
    • 0024104295 scopus 로고
    • AlGaAs/InGaAs/GaAs quantum-well power MISFET at millimeter-wave frequencies
    • Kim B, Matyi R J, Wurtele M and Tserng H Q 1988 AlGaAs/InGaAs/GaAs quantum-well power MISFET at millimeter-wave frequencies IEEE Electron Device Lett. 9 610
    • (1988) IEEE Electron Device Lett. , vol.9 , pp. 610
    • Kim, B.1    Matyi, R.J.2    Wurtele, M.3    Tserng, H.Q.4
  • 7
    • 0031546335 scopus 로고    scopus 로고
    • High-performance InGaP/InGaAs/GaAs step-composition doped-channel field-effect transistor (SCDCFET)
    • Laih L W, Cheng S Y, Wang W C, Lin P H, Chen J Y, Liu W C and Lin W 1997 High-performance InGaP/InGaAs/GaAs step-composition doped-channel field-effect transistor (SCDCFET) Electron. Lett. 33 98
    • (1997) Electron. Lett. , vol.33 , pp. 98
    • Laih, L.W.1    Cheng, S.Y.2    Wang, W.C.3    Lin, P.H.4    Chen, J.Y.5    Liu, W.C.6    Lin, W.7
  • 9
    • 0027677754 scopus 로고
    • Airbridged-gate MESFETs fabricated by isotropic reactive ion etching
    • Hur K Y and Compton R C 1993 Airbridged-gate MESFETs fabricated by isotropic reactive ion etching IEEE Trans. Electron Devices 40 1736
    • (1993) IEEE Trans. Electron Devices , vol.40 , pp. 1736
    • Hur, K.Y.1    Compton, R.C.2
  • 10
    • 0026852510 scopus 로고
    • Elimination of mesa-sidewall gate leakage in InAlAs/InGaAs heterostructures by selective sidewall recessing
    • Bahl S R and Alamo J A D 1992 Elimination of mesa-sidewall gate leakage in InAlAs/InGaAs heterostructures by selective sidewall recessing IEEE Elecron Device Lett. 13 195
    • (1992) IEEE Elecron Device Lett. , vol.13 , pp. 195
    • Bahl, S.R.1    Alamo, J.A.D.2
  • 12
    • 0032115890 scopus 로고    scopus 로고
    • Comparisons between mesaand aribridge-gate AlGaAs/InGaAs doped-channel field-effect transistors
    • Lour W S and Lia C Y 1998 Comparisons between mesaand aribridge-gate AlGaAs/InGaAs doped-channel field-effect transistors Semicond. Sci. Technol. 13
    • (1998) Semicond. Sci. Technol. , vol.13
    • Lour, W.S.1    Lia, C.Y.2
  • 13
    • 36449007901 scopus 로고
    • Characteristics of graded-like multiple-delta-doped GaAs field effect transistors
    • Kao M J, Hsu W C, Hsu R T, Wu Y H, Lin T Y and Chang C Y 1995 Characteristics of graded-like multiple-delta-doped GaAs field effect transistors Appl. Phys. Lett. 66 2505
    • (1995) Appl. Phys. Lett. , vol.66 , pp. 2505
    • Kao, M.J.1    Hsu, W.C.2    Hsu, R.T.3    Wu, Y.H.4    Lin, T.Y.5    Chang, C.Y.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.