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Volumn 48, Issue 1, 1999, Pages 50-54

Error in the thermoresistive sensor-based feedback measurement configuration due to DC amplifier offset voltage

Author keywords

[No Author keywords available]

Indexed keywords

FEEDBACK CIRCUITS; THERMORESISTIVE SENSORS;

EID: 0032673012     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.755059     Document Type: Article
Times cited : (7)

References (10)
  • 6
    • 0002949766 scopus 로고
    • Feedback control theory for constant-temperature hotwire anemometer
    • P. Freymuth, "Feedback control theory for constant-temperature hotwire anemometer," Rev. Sci. Instrum., vol. 38, no. 5, pp. 677-681, 1967.
    • (1967) Rev. Sci. Instrum. , vol.38 , Issue.5 , pp. 677-681
    • Freymuth, P.1
  • 7
    • 0346319030 scopus 로고
    • A study of the constant-temperature hot-wire anemometer
    • A. Perry and G. L. Morrison, "A study of the constant-temperature hot-wire anemometer," J. Fluid. Mech., vol. 47, pp. 577-599, 1971.
    • (1971) J. Fluid. Mech. , vol.47 , pp. 577-599
    • Perry, A.1    Morrison, G.L.2
  • 8
    • 0030085207 scopus 로고    scopus 로고
    • Thermoresistive radiation sensor response time employing electrical heating
    • Feb.
    • G. S. Deep, J. S. R. Neto, A. M. N. Lima, R. C. S. Freire, and P. C. Lobo, "Thermoresistive radiation sensor response time employing electrical heating," IEEE Trans. Instrum. Meas., vol. 45, pp. 332-335, Feb. 1996.
    • (1996) IEEE Trans. Instrum. Meas. , vol.45 , pp. 332-335
    • Deep, G.S.1    Neto, J.S.R.2    Lima, A.M.N.3    Freire, R.C.S.4    Lobo, P.C.5
  • 10
    • 0030673238 scopus 로고    scopus 로고
    • Effect of operational amplifier parameters on the performance of feedback structures with thermoresistive sensors
    • May
    • R. C. S. Freire, G. S. Deep, and A. Oliveira, "Effect of operational amplifier parameters on the performance of feedback structures with thermoresistive sensors," in Proc. Instrumentation Measurement Technology Conf., May 1997, pp. 898-903.
    • (1997) Proc. Instrumentation Measurement Technology Conf. , pp. 898-903
    • Freire, R.C.S.1    Deep, G.S.2    Oliveira, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.