Development of low-energy X-ray fluorescence micro-distribution analysis using a laser plasma X-ray source and multilayer optics

Journal of analytical atomic spectrometry

Volumn 14, Issue 3, 1999, Pages 387-390

  Stuik, Remko ^a   Shmaenok, Leonid A ^a   Fledderus, Henri ^a   Andreev, Sergei S ^b   Shamov, Eugeny A ^b   Zuev, Sergei Yu ^b   Salashchenko, Nikolay N ^b   Bijkerk, Fred ^a  

^a FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN   (Netherlands)

^b INSTITUTE FOR PHYSICS OF MICROSTRUCTURES   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CHARGE COUPLED DEVICES; COMPOSITION; EMISSION SPECTROSCOPY; FLUORESCENCE; LASER PRODUCED PLASMAS; MIRRORS; MULTILAYERS; NONDESTRUCTIVE EXAMINATION; OPTICAL COLLIMATORS; OPTICS; PLASMA DIAGNOSTICS;

LASER PLASMA X RAY SOURCES; LOW ENERGY X RAY FLUORESCENCE MICRODISTRIBUTION ANALYSIS; MULTILAYER OPTICS;

X RAY SPECTROSCOPY;

EID: 0032672184     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/a807614f     Document Type: Article

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