Parameters for improving reliability of full color field emission display devices

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 16, Issue 2, 1998, Pages 736-740

  Kim, J M ^a   Hong, J P ^a   Choi, J H ^a   Ryu, Y S ^a   Hong, S S ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CATHODES; DEPOSITION; DISPLAY DEVICES; ELECTRIC VARIABLES MEASUREMENT; ELECTRODES; ELECTRON TUNNELING; PHOSPHORS; SEMICONDUCTING INDIUM COMPOUNDS; THIN FILMS;

ANODE STRUCTURE; ELECTRICAL AGING; ELECTRICAL RELIABILITY; FIELD EMISSION DISPLAY DEVICES; INDIUM TIN OXIDE;

ELECTRON EMISSION;

EID: 11744315251     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589894     Document Type: Article

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