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Volumn 13, Issue 2, 1999, Pages 185-194

Device temperature and heat generation in power metal-oxide semiconductor field effect transistors

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; MOSFET DEVICES; POWER ELECTRONICS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR JUNCTIONS; TEMPERATURE DISTRIBUTION; THERMAL EFFECTS; THERMAL GRADIENTS;

EID: 0032666885     PISSN: 08878722     EISSN: None     Source Type: Journal    
DOI: 10.2514/2.6435     Document Type: Article
Times cited : (6)

References (8)
  • 2
    • 0042512015 scopus 로고    scopus 로고
    • Hot-carrier degradation in LDD-MOSFETs at high temperatures
    • Dikmen, C. T., Dogan, N. S., O'Sman, M., and Bhatiacharyya, A., "Hot-Carrier Degradation in LDD-MOSFETs at High Temperatures," Solid State Electronics, Vol. 37, No. 12, pp. 1993-1995.
    • Solid State Electronics , vol.37 , Issue.12 , pp. 1993-1995
    • Dikmen, C.T.1    Dogan, N.S.2    O'Sman, M.3    Bhatiacharyya, A.4
  • 3
    • 0344560062 scopus 로고
    • Source-and-drain series resistance of LDD MOSFETs
    • Hsu, F. C., and Chiu, K. Y., "Source-and-Drain Series Resistance of LDD MOSFETs," IEEE Electron Device Letter, Vol. 5, 1981, pp. 148-156.
    • (1981) IEEE Electron Device Letter , vol.5 , pp. 148-156
    • Hsu, F.C.1    Chiu, K.Y.2
  • 5
    • 0027649345 scopus 로고
    • Analysis and optimization of power MOSFETs for cryogenic operation
    • Singh, R., and Baliga, B. J., "Analysis and Optimization of Power MOSFETs for Cryogenic Operation," Solid State Electronics, Vol. 36, No. 8, 1993, pp. 1203-1211.
    • (1993) Solid State Electronics , vol.36 , Issue.8 , pp. 1203-1211
    • Singh, R.1    Baliga, B.J.2
  • 6
    • 0032132249 scopus 로고    scopus 로고
    • Modeling of non-uniform heat dissipation and prediction of hot spots in power transistors
    • Zhu, L., Vafai, K., and Xu, L., "Modeling of Non-Uniform Heat Dissipation and Prediction of Hot Spots in Power Transistors," International Journal of Heat and Mass Transfer, Vol. 41, 1998, pp. 2399-2407.
    • (1998) International Journal of Heat and Mass Transfer , vol.41 , pp. 2399-2407
    • Zhu, L.1    Vafai, K.2    Xu, L.3
  • 8
    • 0025512595 scopus 로고
    • Rigorous thermodynamics treatment of heat generation and conduction in semiconductor device modeling
    • Wachutka, G. K., "Rigorous Thermodynamics Treatment of Heat Generation and Conduction in Semiconductor Device Modeling," IEEE Transactions on Computer-Aided Design, Vol. 9, No. 11, 1990, pp. 1141-1144.
    • (1990) IEEE Transactions on Computer-Aided Design , vol.9 , Issue.11 , pp. 1141-1144
    • Wachutka, G.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.