Modeling of non-uniform heat dissipation and prediction of hot spots in power transistors

International Journal of Heat and Mass Transfer

Volumn 41, Issue 15, 1998, Pages 2399-2407

  Zhu, L ^a   Vafai, K ^a   Xu, L ^a  

^a The Ohio State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; MATHEMATICAL MODELS; TEMPERATURE DISTRIBUTION;

HOT SPOTS; THERMAL BREAKDOWN;

HEAT LOSSES;

EID: 0032132249     PISSN: 00179310     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0017-9310(97)00299-8     Document Type: Article

References (10)

1. Hauser, J. R., The effects of distributed base potential on emitter-current injection density and effective base resistance for stripe transistor geometry. IEEE Transactions of Electron Devices, 1964, ED-11, 238-242.
2. Fletcher, N. H., Some aspects of the design of power transistors. Proceedings of the Institute of Radio Engineering, 1995, 43, 551-559.
3. Jin, J. and Possum, J. G., Non-quasi-static modeling/ implementation of BJT current crowding for seminumerical mixed-mode device/circuit simulation. IEEE Transactions of CAD 1C and Systems, 1992, 11, 759-767.
4. Mohan, N., Undeland, T. M. and Robbins, W. P., Power Electronics, Converters, Applications and Designs. Wiley, New York, 1995, p. 565.
5. Higgins, J. A., Thermal properties of power HBTs. IEEE Transactions of Electron Devices, 1993, 40, 2171-2177.
6. Webb, P. W., Thermal modeling of power gallium Arsenide microwave integrated circuits. IEEE Transactions of Electron Devices, 1993, 40, 867-877.
7. Fushinobu, K., Majumdar, A. and Hijikata, K., Heat generation and transport in submicron semiconductor devices. Journal of Heat Transfer, 1995, 117, 25-31.
8. Taylor, C. and Hood, P., A numerical solution of the Navier-Stokes equations using the finite-element technique. Computational Fluids, 1973, 1, 73-89.
9. FIDAP Theoretical Manual. Fluid Dynamics International, Evasion, IL, 1993.
10. Shaw, M. P., Mitin, V. V., Scholl, E. and Grubin, H. L., The Physics of Instabilities in Solid State Electron Devices. Plenum, 1992, p. 395.