Comparative study of electron and laser beam scanning for local electrical characterization of high-c thin films and junctions

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 3, 1999, Pages 3925-3928

  Shadrin, P M ^a   Divin, Y Y ^a   Keil, S ^a   Martin, J ^b   Huebener, R P ^b  

^a INSTITUTE OF RADIO ENGINEERING AND ELECTRONICS   (Russian Federation)

^b UNIVERSITY OF TÜBINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; FABRICATION; GRAIN BOUNDARIES; JOSEPHSON JUNCTION DEVICES; LASER BEAMS; SCANNING; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SUPERCONDUCTING FILMS;

LASER BEAM INDUCED THERMOELECTRIC RESPONSE; LASER BEAM SCANNING;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0032664074     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.783886     Document Type: Article

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