Short pulse tunneling measurements of the intrinsic josephson junctions in Bi-Sr-Ca-Cu-O

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 3, 1999, Pages 4507-4510

  Suzuki, Minoru ^a  

^a Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC VARIABLES MEASUREMENT; ELECTRON TUNNELING; ELECTRONIC DENSITY OF STATES; HIGH TEMPERATURE SUPERCONDUCTORS; OXIDE SUPERCONDUCTORS; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; TUNNEL JUNCTIONS;

INTRINSIC JOSEPHSON EFFECT; JOULE HEATING;

JOSEPHSON JUNCTION DEVICES;

EID: 0032663513     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.784027     Document Type: Article

References (15)

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