Observation of intrinsic Josephson junction properties on (Bi,Pb)SrCaCuO thin films

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 36, Issue 1 PART A/B, 1997, Pages

  Odagawa, Akihiro ^a   Sakai, Masahiro ^a   Adachi, Hideaki ^a   Setsune, Kentaro ^a   Hirao, Tetsuji ^b   Yoshida, Kunio ^b  

^a PANASONIC CORPORATION   (Japan)

^b OSAKA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

(Bi,Pb)2Sr2Ca2Cu3Ox; High Tc superconductor; Intrinsic Josephson junction; Order parameter of superconductivity; Thin film

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; HEAT TREATMENT; HIGH TEMPERATURE SUPERCONDUCTORS; HYSTERESIS; OXIDE SUPERCONDUCTORS; SPUTTERING; SUPERCONDUCTIVITY; THIN FILMS;

SUPERCONDUCTOR INSULATOR SUPERCONDUCTOR (SIS);

JOSEPHSON JUNCTION DEVICES;

EID: 0030650458     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.l21     Document Type: Article

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