Neutron and X-ray reflectivity analysis of ceramic-metal materials

Thin Solid Films

Volumn 340, Issue 1, 1999, Pages 153-158

  Gibaud, A ^a   Sella, C ^b   Maaza, M ^c   Sung, L ^d   Dura, J A ^d   Satija, S K ^d  

^a UNIVERSITÉ DU MAINE   (France)

^b SORBONNE UNIVERSITÉ   (France)

^c UNIVERSITY OF THE WITWATERSRAND   (South Africa)

^d NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; MORPHOLOGY; NEUTRON DIFFRACTION; OPTICAL VARIABLES MEASUREMENT; PLATINUM; SPUTTERING; STRUCTURE (COMPOSITION); THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

NEUTRON REFLECTIVITY ANALYSIS; OFF SPECULAR SCATTERING; X RAY REFLECTIVITY ANALYSIS;

CERMETS;

EID: 0032663067     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01409-6     Document Type: Article

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