Superconducting transition-edge microcalorimeters for X-ray microanalysis

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 3, 1999, Pages 3177-3181

  Hilton, G C ^a   Wollman, D A ^a   Irwin, K D ^a   Dulcie, L L ^a   Bergren, N F ^a   Martinis, D John M ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; BINDING ENERGY; CALORIMETERS; CHEMICAL BONDS; MICROANALYSIS; PARTICLES (PARTICULATE MATTER); SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DEVICE MANUFACTURE; SENSORS; SILICON WAFERS; TUNGSTEN; X RAY APPARATUS;

SUPERCONDUCTING DETECTORS; SUPERCONDUCTING TRANSITION EDGE MICROCALORIMETERS; X RAY MICROANALYSIS;

SUPERCONDUCTING DEVICES;

EID: 0032660505     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.783704     Document Type: Article

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