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Volumn 127-128, Issue , 1997, Pages 832-836
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Influence of the process parameters on the growth of YSZ-layers prepared by ion beam assisted deposition (IBAD)
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Author keywords
[No Author keywords available]
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Indexed keywords
FILM GROWTH;
ION BEAMS;
ION BOMBARDMENT;
MAGNETRON SPUTTERING;
MULTILAYERS;
SPUTTER DEPOSITION;
SUBSTRATES;
TEXTURES;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
YTTRIUM COMPOUNDS;
INVERTED CYLINDRICAL MAGNETRON (ICM) GUN;
ION BEAM ASSISTED DEPOSITION (IBAD) METHOD;
YTTRIA-STABILIZED ZIRCONIA (YSZ);
ZIRCONIA;
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EID: 0031547755
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(97)00016-5 Document Type: Article |
Times cited : (9)
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References (16)
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