Assessment of overlayer thickness determination model by controlled monolayers

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 14, Issue 1, 1996, Pages 89-94

  Beard, Bruce C ^a   Brizzolara, Robert A ^b  

^a AKZONOBEL   (United States)

^b NAVAL SURFACE WARFARE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030537972     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.579885     Document Type: Article

References (16)

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