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Volumn 266, Issue , 1999, Pages 440-445

Co-deposition of deuterium with silicon doped carbon

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; DEUTERIUM; DOPING (ADDITIVES); ION BEAMS; SILICON; STAINLESS STEEL; THIN FILMS; TITANIUM;

EID: 0032653633     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3115(98)00583-2     Document Type: Article
Times cited : (9)

References (32)
  • 18
    • 0002610225 scopus 로고
    • M.A. Kastner, G.A. Thomas, S.R. Ovshinsky (Eds.), Plenum Press, New York
    • W. Beyer, H. Mell, in: M.A. Kastner, G.A. Thomas, S.R. Ovshinsky (Eds.), Disordered Semiconductors, Plenum Press, New York, 1987, p. 641.
    • (1987) Disordered Semiconductors , pp. 641
    • Beyer, W.1    Mell, H.2
  • 22
    • 0003844928 scopus 로고    scopus 로고
    • IDoMS Nr. G17 MI22 97-05-21 F1
    • ITER Document, IDoMS Nr. G17 MI22 97-05-21 F1, 1997.
    • (1997) ITER Document
  • 25
    • 0003286705 scopus 로고
    • Computer Simulation of Ion-Solid Interactions
    • Springer, Berlin
    • W. Eckstein, Computer Simulation of Ion-Solid Interactions, Materials Science, vol. 10, Springer, Berlin, 1991.
    • (1991) Materials Science , vol.10
    • Eckstein, W.1
  • 29
    • 0001461731 scopus 로고
    • Sputtering by particle bombardment II
    • R. Behrisch (Ed.), Springer, Vienna
    • B.M.U. Scherzer, Sputtering by particle bombardment II, in: R. Behrisch (Ed.), Topics in Applied Physics, Springer, Vienna, vol. 52, 1983, p. 271.
    • (1983) Topics in Applied Physics , vol.52 , pp. 271
    • Scherzer, B.M.U.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.