Electrical characterization of CdS passivation on InP

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 38, Issue 2 B, 1999, Pages 1119-1123

  He, Lili ^a   Dauplaise, Helen ^b   Davis, Andrew ^b   Martin, Eric ^b   Spaziani, Stephen ^b   Vaccaro, Kenneth ^b   Waters, William ^b   Lorenzo, Joseph P ^b  

^a NORTHERN ILLINOIS UNIVERSITY   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

Electrical characterization and chemical bath deposition; InP; Passivation

Indexed keywords

ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONTACTS; ELECTRIC PROPERTIES; ELECTRIC VARIABLES MEASUREMENT; ELECTRODEPOSITION; ELECTRON TRANSPORT PROPERTIES; PASSIVATION; SCHOTTKY BARRIER DIODES; SEMICONDUCTING INDIUM PHOSPHIDE; SURFACE PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

CADMIUM SULFIDE; CHEMICAL BATH DEPOSITION; SCHOTTKY CONTACTS;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0032653023     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.1119     Document Type: Article

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