Surface stabilization of InP using CdS thin films

Materials Research Society Symposium - Proceedings

Volumn 421, Issue , 1996, Pages 99-104

  Davis, A ^a   Dauplaise, H M ^a   Vaccaro, K ^a   Demczyk, B G ^a   Ramseyer, G O ^a   Lorenzo, J P ^a  

^a AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRODEPOSITION; ELECTRONIC DENSITY OF STATES; MISFET DEVICES; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING CADMIUM COMPOUNDS; SOLUTIONS; STABILIZATION; SURFACE TREATMENT; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

CADMIUM SULFIDE; CHEMICAL BATH DEPOSITION PROCESSES; DENSITY OF INTERFACE STATES; QUASISTATIC CAPACITANCE VOLTAGE RESPONSE; SURFACE STABILIZATION;

SEMICONDUCTING INDIUM PHOSPHIDE;

EID: 0030357633     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-421-99     Document Type: Conference Paper

References (10)