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Volumn 38, Issue 2 B, 1999, Pages 1060-1063

Nanoscale ErP islands on InP(001) substrate grown by organometallic vapor-phase epitaxy

Author keywords

Atomic force microscopy; Dislocations; ErP; InP; Scanning tunneling microscopy; Scanning tunneling spectroscopy; Semimetal; Surface states

Indexed keywords

ANISOTROPY; ATOMIC FORCE MICROSCOPY; DISLOCATIONS (CRYSTALS); ERBIUM COMPOUNDS; MORPHOLOGY; ORGANOMETALLICS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR GROWTH; STRAIN; TEMPERATURE; VAPOR PHASE EPITAXY;

EID: 0032651554     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.1060     Document Type: Article
Times cited : (2)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.