Thickness and energy dependence of secondary ion emissions from Langmuir-Blodgett films

Applied Surface Science

Volumn 142, Issue 1, 1999, Pages 614-618

  Hoshi, T ^a   Yoshida, S ^b   Watanabe, T ^b   Ichinohe, Y ^c   Kudo, M ^c  

^a ULVAC PHI Inc   (Japan)

^b INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^c SEIKEI UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BOND STRENGTH (CHEMICAL); CADMIUM; ENERGY TRANSFER; ION BEAMS; IONS; MECHANICAL PROPERTIES; POSITIVE IONS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SILICON; SILVER; SUBSTRATES;

CATIONIZED IONS; PRIMARY BEAM ENERGY; SECONDARY ION EMISSIONS; THICKNESS;

LANGMUIR BLODGETT FILMS;

EID: 0032651355     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00698-9     Document Type: Article

References (5)

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