![]() |
Volumn 44, Issue 18, 1999, Pages 3195-3202
|
Accelerated durability testing of electrochromic windows
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DEGRADATION;
DURABILITY;
ELECTROOPTICAL DEVICES;
TESTING;
THERMAL EFFECTS;
ACCELERATED LIFE TESTING;
ELECTROCHROMIC DEVICE;
ELECTROCHROMIC WINDOWS;
ELECTROCHROMISM;
|
EID: 0032650084
PISSN: 00134686
EISSN: None
Source Type: Journal
DOI: 10.1016/S0013-4686(99)00037-7 Document Type: Article |
Times cited : (43)
|
References (11)
|