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Volumn 44, Issue 18, 1999, Pages 3195-3202

Accelerated durability testing of electrochromic windows

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; DURABILITY; ELECTROOPTICAL DEVICES; TESTING; THERMAL EFFECTS;

EID: 0032650084     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0013-4686(99)00037-7     Document Type: Article
Times cited : (43)

References (11)
  • 3
    • 0005351151 scopus 로고
    • Large Area Chromogenics: Materials and Devices for Transmittance Control
    • Lampert C.M., Granqvist C.G. Large Area Chromogenics: Materials and Devices for Transmittance Control. SPIE. IS4:1990;2.
    • (1990) SPIE , vol.4 , pp. 2
    • Lampert, C.M.1    Granqvist, C.G.2
  • 8
    • 0031289372 scopus 로고    scopus 로고
    • Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XV
    • C.M. Lampert, C.G. Granqvist, M. Gratzel, & S.K. Deb.
    • Czanderna A.W., Zhang J.-G., Tracy C.E., Benson D.K., Deb S.K. Lampert C.M., Granqvist C.G., Gratzel M., Deb S.K. Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XV. SPIE. vol. 3138:1997;68-75.
    • (1997) SPIE , vol.3138 , pp. 68-75
    • Czanderna, A.W.1    Zhang, J.-G.2    Tracy, C.E.3    Benson, D.K.4    Deb, S.K.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.