Accelerated life testing of large-area electrochromic devices for window applications

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3138, Issue , 1997, Pages 68-75

  Czanderna, A W ^a   Zhang, J G ^a   Tracy, C E ^a   Benson, D K ^a   Deb, S K ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

Accelerated life testing; Degradation factors; Degradation stresses; Durability criteria; Electrochromic windows; Energy savings; Large area devices; Large component environmental chambers

Indexed keywords

BLEACHING; COLOR; CURRENT VOLTAGE CHARACTERISTICS; DEGRADATION; DURABILITY; ELECTROOPTICAL EFFECTS; LIGHT ABSORPTION; LIGHT REFLECTION; LIGHT TRANSMISSION; MATERIALS TESTING; SOLAR CONTROL FILMS; SOLAR RADIATION; SPECTRUM ANALYSIS; STRESSES; WINDOWS;

ACCELERATED LIFE TESTING (ACLT) METHODS; ELECTROCHROMIC WINDOWS (ECW); REAL-TIME TESTING;

ELECTROCHROMIC DEVICES;

EID: 0031289372     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.609633     Document Type: Conference Paper

References (7)

1. Durability evaluation of electrochromic devices-an industry perspective
2. Durability issues and service lifetime prediction of electrochromic windows for buildings applications