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Volumn 112, Issue 1-2, 1999, Pages 23-33

A comparative study of TSC, TSCAP, DLTS analysis in irradiated Si detectors

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0032647975     PISSN: 03693546     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (12)
  • 3
    • 0020996397 scopus 로고
    • edited by R. K. WILLARDSON and A. C. BEER, Academic Press, New York
    • LOOK D. C., in Semiconductor and Semimetals, edited by R. K. WILLARDSON and A. C. BEER, Vol. 19 (Academic Press, New York) 1983, p. 75.
    • (1983) Semiconductor and Semimetals , vol.19 , pp. 75
    • Look, D.C.1
  • 6
    • 0009370847 scopus 로고    scopus 로고
    • A comparative study of heavily irradiated silicon and non irradiated SI LEC GaAs detectors
    • Albuquerque , submitted for pubblication on Conference Issue of IEEE Trans. Nucl. Sci.
    • BIGGERI U. et al., A comparative study of heavily irradiated silicon and non irradiated SI LEC GaAs detectors, in Nuclear Science Symposium, Albuquerque 1997, submitted for pubblication on Conference Issue of IEEE Trans. Nucl. Sci.
    • (1997) Nuclear Science Symposium
    • Biggeri, U.1
  • 8
    • 0004254425 scopus 로고
    • edited by O. MACHLUNG (Springer Verlag, Dublin)
    • LANDOLT-BORNSTEIN, Semiconductor, edited by O. MACHLUNG Vol. 17a (Springer Verlag, Dublin) 1982.
    • (1982) Semiconductor , vol.17 A
    • Landolt-Bornstein1
  • 9
    • 36149033101 scopus 로고
    • DAVIS G. et al., J. Phys. C, 19 (1986) 841.
    • (1986) J. Phys. C , vol.19 , pp. 841
    • Davis, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.