I-V characteristic of a single intrinsic tunnel junction on bi-2223 thin film

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 3, 1999, Pages 3012-3015

  Odagawa, A ^a  

^a PANASONIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CURRENT VOLTAGE CHARACTERISTICS; GOLD; JOSEPHSON JUNCTION DEVICES; MAGNETIC HYSTERESIS; MICROWAVES; SPECTROSCOPY;

INTRINSIC TUNNEL JOSEPHSON JUNCTION; MICROWAVE IRRADIATION; SCANNING TUNNELING SPECTROSCOPY;

SUPERCONDUCTING FILMS;

EID: 0032645878     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.783663     Document Type: Article

References (16)

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