White-light interferometry using pseudo random-modulation for high-sensitivity and high-selectivity measurements

Optics Communications

Volumn 162, Issue 1, 1999, Pages 11-15

  Hirai, Akiko ^a   Seta, Katuo ^a   Matsumoto, Hirokazu ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT MODULATION; LIGHT SOURCES; OPTICAL VARIABLES MEASUREMENT; SIGNAL TO NOISE RATIO;

PSEUDO RANDOM-MODULATION; WHITE-LIGHT INTERFEROMETRY;

INTERFEROMETRY;

EID: 0032644322     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(99)00064-4     Document Type: Article

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