SCOPUS 정보 검색 플랫폼

Advanced Materials for Optics and Electronics

Volumn 9, Issue 1, 1999, Pages 15-18

Protonic nano-rectifier: STM imaging

(2) Langer, Jerzy J a Martyński, Marcin a

a ADAM MICKIEWICZ UNIVERSITY (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC PROPERTIES; ELECTRONIC PROPERTIES; MOLECULAR DYNAMICS; PROTONS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR JUNCTIONS;

MOLECULAR ELECTRONICS; PROTONIC NANORECTIFIER; SELF ASSEMBLED COMPLEX MOLECULAR LAYER;

NANOTECHNOLOGY;

EID: 0032643435 PISSN: 10579257 EISSN: None Source Type: Journal
DOI: 10.1002/(SICI)1099-0712(199901/02)9:1<15::AID-AMO362>3.0.CO;2-O Document Type: Article

Times cited : (6)

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