Spectral interferometry of semiconductor nanostructures

IEEE Journal of Quantum Electronics

Volumn 35, Issue 4, 1999, Pages 510-522

  Tignon, Jerome ^a   Marquezini, Maria V ^a   Hasche, Tom ^a   Chemla, Daniel S ^a,b,c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b TELECOM PARISTECH   (France)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXCITONS; HETEROJUNCTIONS; INTERFEROMETRY; REFRACTIVE INDEX; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM WELLS;

FANO RESONANCE; FOURIER TRANSFORM SPECTRAL INTERFEROMETRY;

NANOSTRUCTURED MATERIALS;

EID: 0032642850     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/3.753655     Document Type: Article

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