Characterization of microstructure and magnetic domain structure in Sm-Co based permanent magnets by advanced transmission electron microscopy

Nippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals

Volumn 63, Issue 4, 1999, Pages 542-548

  Yang, Jun Mo ^a   Shindo, Daisuke ^a   Takeguchi, Masaki ^b,c   Kawasaki, Masahiro ^b   Oikawa, Tetsuo ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b JEOL LTD   (Japan)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; ELECTRON GUNS; HIGH RESOLUTION ELECTRON MICROSCOPY; HOLOGRAPHY; MAGNETIC DOMAINS; MAGNETIC FIELDS; SAMARIUM ALLOYS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON HOLOGRAPHY; ELEMENTAL MAPPING METHOD; LORENTZ ELECTRON MICROSCOPY;

PERMANENT MAGNETS;

EID: 0032641832     PISSN: 00214876     EISSN: None     Source Type: Journal    
DOI: 10.2320/jinstmet1952.63.4_542     Document Type: Article

References (28)

1. J. Fidler, P. Skalicky and F. Rothwarf: IEEE Trans. Magn., MAG-19(1983), 2041.
2. K. Hiraga, M. Hirabayashi and N. Ishigaki: J. Microsc., 142(1986), 201.
3. K. N. Melton and R. S. Perkins: J. Appl. Phys., 47(1976), 2671.
4. J. D. Livingston and D. L. Martin: J. Appl. Phys., 48(1977), 1350.
5. K. N. Melton and H. Nagel: J. Appl. Phys., 48(1977), 2608.
6. R. K. Mishra, G. Thomas, T. Yoneyama, A. Fukuno and T. Ojima: J. Appl. Phys., 52(1981), 2517.
7. T. Oikawa, N. Mori, N. Takano, Y. Harada and M. Ohnishi: J. Electron Microsc., 39(1990), 437.
8. D. Shindo, K. Hiraga, T. Oikawa and N. Mori: J. Electron Microsc., 39(1990), 449.
9. D. Shindo, T. Oku, J. Kudoh and T. Oikawa: Ultramicroscopy, 54(1994), 221.
10. J.-M. Yang, D. Shindo and H. Hiroyoshi: Mater. Trans., JIM, 38(1997), 363.
11. L. Rabenberg, R. K. Mishra and G. Thomas: J. Appl. Phys., 53(1982), 2389.
12. G. C. Hadjipanayis: J. Appl. Phys., 55(1984), 2091.
13. A. E. Ray: J. Appl. Phys., 55(1984), 2094.
14. A. E. Ray: IEEE Trans. Magn., MAG-20(1984), 1614.
15. L. Reimer: Transmission Electron Microscopy, 3rd edition, Springer-Verlag, Berlin, Heidelberg, (1993), Chap. 6.
16. R. S. Perkins, S. Gaiffi and A. Menth: IEEE Trans. Magn., MAG-11(1975), 1431.
17. H. Nagel: J. Appl. Phys., 50(1979), 1026.
18. H. W. Fuller and M. E. Hale: J. Appl. Phys., 31(1960), 238.
19. L. Reimer and H. Kappert: Z. Ang. Phys., 26(1969), 58.
20. H. Kappert: Z. Ang. Phys., 29(1970), 139.
21. H. Kappert and P. Schmiesing: Phys. Stat. Sol. (a), 4(1971), 737.
22. A. Tonomura: J. Electron Microsc., 33(1984), 101.
23. T. Tanji, Q. Ru and A. Tonomura: Appl. Phys. Lett., 69(1996), 2623.
24. A. Tonomura: J. Electron Microsc., 38(1989), S43.
25. D. Shindo, Y. Murakami and T. Hirayama: Mater. Trans., JIM, 39(1998), 322.
26. T. Hirayama, Q. Ru, T. Tanji and A. Tonomura: Appl. Phys. Lett., 63(1993), 418.