Electrical and optical study of charge traps at passivated GaAs surfaces

Materials Research Society Symposium - Proceedings

Volumn 573, Issue , 1999, Pages 107-118

  Mochizuki, Yasunori ^a  

^a NEC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACES (MATERIALS); MESFET DEVICES; PASSIVATION; SEMICONDUCTING SILICON; SILICA;

SURFACE CHARGES;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0032639411     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-573-107     Document Type: Article

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