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Volumn 9, Issue 2 PART 2, 1999, Pages 1952-1955
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Ion-beam milling of ybco thin films and their characterization by time-resolved pump-probe method
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Author keywords
[No Author keywords available]
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Indexed keywords
ARGON;
CHARACTERIZATION;
ETCHING;
ION BEAMS;
LASER PULSES;
MILLING (MACHINING);
MORPHOLOGY;
RAMAN SPECTROSCOPY;
REFLECTION;
SUPERCONDUCTING FILMS;
SUPERCONDUCTING TRANSITION TEMPERATURE;
SUPERCONDUCTIVITY;
ION BEAM ETCHING;
ION BEAM MILLING;
QUASIPARTICLES;
REFLECTIVITY CHANGE;
RELAXATION TIME;
SUPERCARRIER DENSITY;
TIME RESOLVED PUMP PROBE METHOD;
OXIDE SUPERCONDUCTORS;
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EID: 0032639135
PISSN: 10518223
EISSN: None
Source Type: Journal
DOI: 10.1109/77.784843 Document Type: Article |
Times cited : (2)
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References (6)
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