|
Volumn 18, Issue 3, 1999, Pages 229-232
|
Growth model of oval defect structures in MBE GaAs layers
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CRYSTAL ORIENTATION;
CRYSTALLOGRAPHY;
MATHEMATICAL MODELS;
MICROANALYSIS;
MOLECULAR BEAM EPITAXY;
NUCLEATION;
PHOTOLUMINESCENCE;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTOR GROWTH;
STACKING FAULTS;
SUBSTRATES;
ELECTRON PROBE MICROANALYSIS (EPMA);
SEMICONDUCTING FILMS;
|
EID: 0032637867
PISSN: 02618028
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1006617408604 Document Type: Article |
Times cited : (8)
|
References (21)
|