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Volumn 18, Issue 3, 1999, Pages 229-232

Growth model of oval defect structures in MBE GaAs layers

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; MATHEMATICAL MODELS; MICROANALYSIS; MOLECULAR BEAM EPITAXY; NUCLEATION; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR GROWTH; STACKING FAULTS; SUBSTRATES;

EID: 0032637867     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1006617408604     Document Type: Article
Times cited : (8)

References (21)
  • 19
    • 0003627422 scopus 로고
    • International Union of Crystallography; Oxford Univ. Press
    • "Fundamentals of Crystallography", Ed. C. Giacovazzo, (International Union of Crystallography; Oxford Univ. Press, 1992) p. 134-37.
    • (1992) Fundamentals of Crystallography , pp. 134-137
    • Giacovazzo, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.